Tuesday, November 16, 2021

https://www.linkedin.com/pulse/application-ai-ppap-process-discussion-john-m-cachat

 

There are billions of lines of information created by the PPAP process, including process flows, PFMEAs, and Control Plans and Gage Studies.  This information can be used to provide the organization a competitive advantage and assure defect reduction with the application of augmented intelligence. 

 



 

Artificial Intelligence is the creation of machines to work and react like humans, Augmented Intelligence is using those same machines with a different approach – to enhance the human worker. Augmented Intelligence involves people and machines working together, playing to their own strengths to achieve greater business value. The primary objective of Augmented Intelligence is to empower humans to work better and smarter

 

 

I have been working on improving the PPAP process for several years.

 

I often hear people say, it would be great if I could only understand:

        What control methods are allowing defects get through? What failure modes are common across all programs/parts?

        What improvements are most effective at reducing risk?

        Are their common failure causes of the top 10 highest defect costs parts?

        What tool/equipment is associated with the top 10 highest defect costs parts?

        Are there any trends by Part Family?

        MRB review of expected versus actual defects and risks

 

 

For a document authoring viewpoint, these questions are being asked:

        Do we need to do a PPAP on this part?

        Do I have to study all operations?

        Do I have to study all product/process characteristics?

        How do I replace RPN with Action Priority logic?

 

Can we predict performance based on past results?

Occurrence (O)         It is happening more than we thought

Detection (D)             It is being discovered by customer, not us

Severity (S)                 It costs a lot more than we thought

RPN                             Occurrence x Detection x Severity vs. OS and DS

Failure Mode             Have we seen this before?

Failure Effect            Do we know the defect cost?

Failure Cause            Can we error proof?

 

 

 

I greatly appreciate hearing your thoughts on this subject.

 

Sincerely,

 

John M. Cachat

PeProSo, LLC

001-440-915-2650

jmc@peproso.com

www.linkedin.com/in/johncachat

 

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